Apex Series <Semiconductor and Wafer Inspection>
Defects in wafers and microstructures can be detected more accurately and efficiently!
The "Apex Series" is suitable for industrial imaging where accurate color information is required. Here, we will introduce an example in "semiconductor and wafer inspection." Due to the extremely low overlap of spectra, multiple lighting methods such as dark field, bright field, and backlight can be used simultaneously with light of different wavelengths without causing interference between channels. As a result, defects in wafers and fine structures can be detected in more detail and efficiently. 【Applications (Example)】 ■ Display inspection ■ Electronic components and printed circuit board (PCB) inspection ■ MLCC (Multilayer Ceramic Capacitor) inspection ■ Food inspection ■ Pharmaceutical quality inspection ■ Semiconductor and wafer inspection *For more details, please download the PDF or feel free to contact us.
- Company：ジェイエイアイコーポレーション
- Price：Other
